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SECOND EDITION
Tunable
Laser
Optics
Tunable
Laser
Optics
F.J. Duarte
INTERFEROMETRIC OPTICS, ROCHESTER, NEW YORK, USA
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To my family.
vii
xiii
11.1 Sagnac interferometer. All three mirrors M1, M2, and M3 are assumed
to be identical.............................................................................................. 256
11.2 Triangular Sagnac interferometer ............................................................... 257
11.3 Mach–Zehnder interferometer .................................................................... 257
11.4 Prismatic Mach–Zehnder interferometer ................................................... 258
11.5 Michelson interferometer............................................................................ 259
11.6 N-slit interferometer. CMOS, complementary metal–oxide–
semiconductor; TEM00, single transverse mode .........................................260
11.7 The Hanbury Brown and Twiss interferometer. The light, from an
astronomical source, is collected at mirrors M1 and M2 and focused
onto detectors d1 and d2. The current generated at these detectors,
i1 and i2, interfere at the electronics to produce an interference signal
characterized by an equation of the form of Equation 11.18 with N = 2.... 261
11.8 Fabry–Pérot interferometer (a) and Fabry–Pérot etalon (b). Dark lines
represent coated surfaces. Focusing optics is often used with these
interferometers when used in linewidth measurements ............................. 263
11.9 Multiple-beam interferometer: (a) Multiple internal reflection diagram;
(b) detailed view depicting the angles of incidence and refraction ............ 263
11.10 Fabry–Pérot interferogram depicting single-longitudinal-mode
oscillation, at Δν ≈ 700 MHz, from a tunable multiple-prism grating
solid-state oscillator ....................................................................................266
11.11 Measured double-slit (N = 2) interferogram generated with a
broadband light source. The slits are 50 μm wide separated
by 50 μm and D x j = 10 cm. Comparison with other two-slit
interferograms generated with coherent sources (see Figures 11.12
and 11.13) reveals lack of spatial definition and low visibility as
defined by Equation 11.50 ....................................................................... 269
11.12 Double-slit interferogram from the narrow-linewidth emission from
the 3s2 − 2 p10 transition of a He–Ne laser, at λ ≈ 543.3 nm. The
visibility of this interferogram is V ≈ 0.95. Here, N = 2, the slits are
50 μm wide separated by 50 μm, and D x j = 5 cm ................................... 270
11.13 Double-slit interferogram from an electrically excited organic
semiconductor interferometric emitter at λ ≈ 540 nm. The visibility
of this interferogram is less than V ≈ 0.90. Here, N = 2, the slits are
50 μm wide separated by 50 μm, and D x j = 5 cm .................................... 270
11.14 Interferograms at λ1 = 580 nm (a), λ 2 = 585 nm (b), λ 3 = 590 nm (c),
and λ 4 = 591 nm (d). These calculations are for slits 100 μm wide,
separated by 100 μm, and N = 50. The j-to-x distance is D x j = 100 cm .....271
11.15 Multiple-etalon wavelength meter .............................................................. 273
11.16 (a) Fizeau wavelength meter. (b) Geometrical details of a Fizeau
interferometer ............................................................................................. 274
12.1 Simple optical configuration for absorption measurements using
a spectrometer............................................................................................. 278
12.2 Simplified optical configuration for fluorescence and emission
measurements, in an optically pumped laser system, using
spectrophotometers. A narrow-linewidth tunable laser excites
xxv
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